SIEGEL, M. Cartography Lab at Rutgers University. Cartographic Perspectives, [S. l.], n. 26, p. 48, 1997. DOI: 10.14714/CP26.722. Disponível em: https://cartographicperspectives.org/index.php/journal/article/view/cp26-siegel. Acesso em: 20 jun. 2026.